Michael Lauter
24Patents
2h-index
36Co-inventors
57Inventor score
Filing activity: Oct 4, 2002 → Sep 14, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9777192B2 | Chemical mechanical polishing (CMP) composition comprising a protein | Electricity | 2 | Active |
| US10647900B2 | Chemical-mechanical polishing composition comprising benzotriazole derivatives as corrosion inhibitors | Electricity | 2 | Active |
| US6662594B2 | Apparatus and process for producing gaseous oxygen under elevated pressure | Emerging Cross-Sectional Technologies | 2 | Expired |
| US8980750B2 | Chemical mechanical polishing (CMP) composition comprising a non-ionic surfactant and a carbonate salt | Electricity | 2 | Active |
| US6708523B2 | Process and apparatus for producing high-purity nitrogen by low-temperature fractionation of air | Emerging Cross-Sectional Technologies | 2 | Expired |
| US10899945B2 | Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt comprising substrates | Electricity | 2 | Active |
| US10385236B2 | Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt and / or cobalt alloy comprising substrates | Electricity | 2 | Active |
| US9255214B2 | Chemical mechanical polishing (CMP) composition comprising inorganic particles and polymer particles | Electricity | 1 | Active |
| US10844325B2 | Composition for post chemical-mechanical-polishing cleaning | Chemistry; Metallurgy | 0 | Active |
| US10738219B2 | Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt and / or cobalt alloy comprising substrates | Chemistry; Metallurgy | 0 | Active |
| US12351737B2 | Chemical mechanical polishing of substrates containing copper and ruthenium | Electricity | 0 | Active |
| US10570316B2 | Chemical mechanical polishing (CMP) composition | Chemistry; Metallurgy | 0 | Active |
| US11993729B2 | Chemical mechanical polishing composition | Electricity | 0 | Active |
| US12378439B2 | Compositions for tungsten etching inhibition | Electricity | 0 | Active |
| US10865361B2 | Composition for post chemical-mechanical-polishing cleaning | Chemistry; Metallurgy | 0 | Active |
| US9263296B2 | Chemical mechanical polishing (CMP) composition comprising two types of corrosion inhibitors | Chemistry; Metallurgy | 0 | Active |
| US11168239B2 | Chemical-mechanical polishing composition comprising benzotriazole derivatives as corrosion inhibitors | Electricity | 0 | Active |
| US11264250B2 | Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt and / or cobalt alloy comprising substrates | Chemistry; Metallurgy | 0 | Active |
| US11725117B2 | Chemical mechanical polishing of substrates containing copper and ruthenium | Chemistry; Metallurgy | 0 | Active |
| US11286402B2 | Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt and / or cobalt alloy comprising substrates | Electricity | 0 | Active |
| US9487674B2 | Chemical mechanical polishing (CMP) composition comprising a glycoside | Electricity | 0 | Active |
| US10407594B2 | Chemical mechanical polishing (CMP) composition comprising a polymeric polyamine | Electricity | 0 | Active |
| US10227506B2 | Chemical mechanical polishing (CMP) composition for high effective polishing of substrates comprising germanium | Electricity | 0 | Active |
| US10844333B2 | Composition for post chemical-mechanical-polishing cleaning | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.