Patent · US Active

Use of a chemical mechanical polishing (CMP) composition for polishing of cobalt and / or cobalt alloy comprising substrates

US11286402B2 · kind B2 · utility

0Cited by
3References
12Claims
0Family size

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Inventors

Key dates

Filing dateDec 11, 2015
Grant dateMar 29, 2022
Priority date
Expiry dateDec 11, 2035

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/461
  • WIPO fieldBasic materials chemistry
  • WIPO sectorChemistry

Abstract

Use of a chemical mechanical polishing (CMP) composition (Q) for chemical mechanical polishing of a substrate (S) comprising (i) cobalt and/or (ii) a cobalt alloy, wherein the CMP composition (Q) comprises (A) Inorganic particles (B) a triazine derivative of the general formula (I) wherein R1, R2, R3, R4, R5 and R6 are independently from each other H, methyl, ethyl, propyl, butyl, pentyl, C2-C10-alkylcarboxylic acid, hydroxymethyl, vinyl or allyl (C) at least one amino acid, (D) at least one oxidizer (E) an aqueous medium and wherein the CMP composition (Q) has a pH of from 7 to 10.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.