Patent · US Expired

Parallel plate electrode plasma reactor having an inductive antenna and adjustable radial distribution of plasma ion density

US6054013A · kind A · utility

497Cited by
47References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 24, 1996
Grant dateApr 25, 2000
Priority date
Expiry dateOct 24, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6831
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

There is disclosed a plasma reactor for processing a semiconductor workpiece such as a wafer, including a chamber having an overhead ceiling with a three-dimensional shape such as a hemisphere or dome. The reactor further includes an inductive antenna over the ceiling which may be conformal or nonconformal in shape with the ceiling. The ceiling may be a semiconductor material so that it can function as both a window for the inductive field of the antenna as well as an electrode which can be grounded, or to which RF power may be applied or which may be allowed to float electrically. The reactor includes various features which allow the radial distribution of the plasma ion density across the wafer surface to be adjusted to an optimum distribution for processing uniformity across the wafer surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.