Patent · US Expired

Wafer support system

US6491757B2 · kind B2 · utility

19Cited by
96References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 17, 2001
Grant dateDec 10, 2002
Priority date
Expiry dateAug 17, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An apparatus for processing a substrate comprises a susceptor for supporting the substrate, an upper heat source spaced above the susceptor, a lower heat source spaced below the susceptor, and a controller. The controller provides power to the heat sources at a selected ratio between the sources. The controller is configured to vary the ratio during a high temperature processing cycle of a substrate to thereby vary the ratio of the heat provided by the heat sources during the cycle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.