Patent · US Active

Self-aligned multiple gate transistor formed on a bulk substrate

US8679924B2 · kind B2 · utility

6Cited by
0References
14Claims
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Assignee

Inventors

Key dates

Filing dateJan 31, 2011
Grant dateMar 25, 2014
Priority date
Expiry dateOct 9, 2031

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/024

Abstract

Three-dimensional transistors in a bulk configuration may be formed on the basis of gate openings or gate trenches provided in a mask material. Hence, self-aligned semiconductor fins may be efficiently patterned in the underlying active region in a portion defined by the gate opening, while other gate openings may be efficiently masked, in which planar transistors are to be provided. After patterning the semiconductor fins and adjusting the effective height thereof, the further processing may be continued on the basis of process techniques that may be commonly applied to the planar transistors and the three-dimensional transistors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.