Patent · US Active

Graphene and metal interconnects with reduced contact resistance

US9293412B2 · kind B2 · utility

6Cited by
18References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 4, 2014
Grant dateMar 22, 2016
Priority date
Expiry dateDec 4, 2034

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A structure including a first metal line in a first interconnect level, the first metal line comprising one or more graphene portions, a second metal line in a second interconnect level above the first interconnect level, the second metal line comprising one or more graphene portions, and a metal via comprising a palladium liner extends vertically and electrically connects the first metal line with the second metal line, the via is at least partially embedded in the first metal line such that the palladium liner is in direct contact with at least an end portion of the one or more graphene portions of the first metal line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.