Patent assignee · US · COMPANY

Celestech, Inc.

20Patents
3Active
20Granted
36Portfolio score

Filing activity: Jan 8, 1990 → Jan 30, 2009 · 3 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US5204144A Method for plasma deposition on apertured substrates Chemistry; Metallurgy 90 Expired
US5846330A Gas injection disc assembly for CVD applications Chemistry; Metallurgy 67 Expired
US5951771A Plasma jet system Electricity 60 Expired
US5863605A Diamond film deposition Chemistry; Metallurgy 44 Expired
USRE34806E Magnetoplasmadynamic processor, applications thereof and methods General 38 Expired
US5342660A Method for plasma jet deposition Chemistry; Metallurgy 33 Expired
US5679404A Method for depositing a substance with temperature control Chemistry; Metallurgy 19 Expired
US5487787A Apparatus and method for plasma deposition Chemistry; Metallurgy 17 Expired
US5551983A Method and apparatus for depositing a substance with temperature control Chemistry; Metallurgy 16 Expired
US5683759A Method for depositing a substance with temperature control Chemistry; Metallurgy 14 Expired
US5340401A Diamond deposition cell Chemistry; Metallurgy 11 Expired
US6406760B1 Diamond film deposition on substrate arrays Chemistry; Metallurgy 11 Expired
US5435849A Apparatus for plasma deposition Chemistry; Metallurgy 9 Expired
US5182093A Diamond deposition cell Emerging Cross-Sectional Technologies 9 Expired
US6173672A Diamond film deposition on substrate arrays Chemistry; Metallurgy 8 Expired
US7825795B2 Container tracking system Physics 2 Active
US5821492A Radiation and regeneratively cooled arc jet device for thin diamond film deposition Electricity 1 Expired
US7485871B2 High radiation environment tunnel monitoring system and method Physics 1 Active
US6099966A Deposition target medium for diamond film deposition Emerging Cross-Sectional Technologies 1 Expired
US8309934B2 High radiation environment tunnel monitoring system and method Physics 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.