DAFCA, INC.
9Patents
2Active
9Granted
33Portfolio score
Filing activity: Apr 28, 2003 → Dec 7, 2005 · 2 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7296201B2 | Method to locate logic errors and defects in digital circuits | Physics | 267 | Expired |
| US7058918B2 | Reconfigurable fabric for SoCs using functional I/O leads | Physics | 38 | Expired |
| US7493247B2 | Integrated circuit analysis system and method using model checking | Physics | 26 | Active |
| US7348796B2 | Method and system for network-on-chip and other integrated circuit architectures | Electricity | 23 | Active |
| US7137086B2 | Assertion checking using two or more cores | Physics | 22 | Expired |
| US7426705B1 | Combined hardware/software assertion checking | Physics | 22 | Expired |
| US7305635B1 | Serial implementation of assertion checking logic circuit | Physics | 18 | Expired |
| US7493434B1 | Determining the value of internal signals in a malfunctioning integrated circuit | Physics | 17 | Expired |
| US7146548B1 | Fixing functional errors in integrated circuits | Physics | 15 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.