Mochii, Inc.
16Patents
16Active
16Granted
49Portfolio score
Filing activity: Feb 10, 2011 → Jul 3, 2023 · 1 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8748818B2 | Incoherent transmission electron microscopy | Electricity | 27 | Active |
| US9564291B1 | Hybrid charged-particle beam and light beam microscopy | Electricity | 17 | Active |
| US8324574B2 | Aberration-correcting dark-field electron microscopy | Electricity | 7 | Active |
| US8389937B2 | Incoherent transmission electron microscopy | Electricity | 6 | Active |
| US9997331B1 | Charged-particle beam microscopy | Electricity | 5 | Active |
| US9899186B1 | Charged-particle beam microscope with an evaporator | Electricity | 4 | Active |
| US10847343B1 | Microscopy | Electricity | 4 | Active |
| US8569694B2 | Aberration-correcting dark-field electron microscopy | Electricity | 3 | Active |
| US8598527B2 | Scanning transmission electron microscopy | Emerging Cross-Sectional Technologies | 3 | Active |
| US11404243B1 | Microscopy | Electricity | 2 | Active |
| US12094684B1 | Scanning charged-particle-beam microscopy with energy-dispersive x-ray spectroscopy | Electricity | 1 | Active |
| US8927932B2 | Scanning transmission electron microscopy for imaging extended areas | Emerging Cross-Sectional Technologies | 1 | Active |
| US11398365B1 | Positioning samples for microscopy, inspection, or analysis | Electricity | 1 | Active |
| US8921787B2 | Incoherent transmission electron microscopy | Electricity | 1 | Active |
| US12397313B1 | Coating of samples for microscopy | Physics | 0 | Active |
| US11850620B1 | Coating of samples for microscopy | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.