Nanofactory Instruments AB
8Patents
2Active
8Granted
30Portfolio score
Filing activity: Feb 20, 2001 → Dec 1, 2008 · 2 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7654159B2 | MEMS nanoindenter | Emerging Cross-Sectional Technologies | 36 | Expired |
| US6452307B1 | Device for micropositioning of an object | Emerging Cross-Sectional Technologies | 11 | Expired |
| US7586105B2 | Microfabricated cantilever chip | Electricity | 7 | Active |
| US8250667B2 | Iterative feedback tuning in a scanning probe microscope | Physics | 4 | Active |
| US6864483B2 | Method for increasing the measurement information available from a transmission electron microscope and a transmission electron microscopy device | Emerging Cross-Sectional Technologies | 4 | Expired |
| US7363802B2 | Measurement device for electron microscope | Electricity | 1 | Expired |
| US6917140B2 | Micropositioning device | Electricity | 1 | Expired |
| US6924489B2 | Device for reducing the impact of distortions in a microscope | Emerging Cross-Sectional Technologies | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.