Patent assignee · CN · COMPANY

Zing Semiconductor Corporation

40Patents
40Active
40Granted
52Portfolio score

Filing activity: Jan 22, 2016 → Nov 7, 2023

Most-cited patents

PatentTitleAreaCited byStatus
US9972637B2 Metal-ono-vacuum tube charge trap flash (VTCTF) nonvolatile memory and the method for making the same Electricity 5 Active
US9647067B1 FinFET and fabrication method thereof Electricity 3 Active
US9773891B1 FinFET and fabrication method thereof Electricity 3 Active
US9834861B2 Method for growing monocrystalline silicon and monocrystalline silicon ingot prepared thereof Chemistry; Metallurgy 2 Active
US9779999B2 Complementary nanowire semiconductor device and fabrication method thereof Electricity 2 Active
US9721846B1 Hybrid integration fabrication of nanowire gate-all-around GE PFET and polygonal III-V PFET CMOS device Electricity 1 Active
US12046520B2 Method for detecting temperature of thermal chamber Physics 1 Active
US9640615B1 Method for making III-V nanowire quantum well transistor Electricity 1 Active
US10100431B2 Method for growing monocrystalline silicon and monocrystalline silicon ingot prepared thereof Chemistry; Metallurgy 1 Active
US9837517B2 Method for making III-V nanowire quantum well transistor Electricity 1 Active
US11923254B2 Method for detecting temperature of thermal chamber Physics 1 Active
US9773670B2 Method of preparation of III-V compound layer on large area Si insulating substrate Electricity 0 Active
US12334403B2 Measuring method of resistivity of a wafer Physics 0 Active
US11393712B2 Silicon on insulator structure and method of making the same Electricity 0 Active
US12398485B2 Method of detecting crystallographic defects and method of growing an ingot Chemistry; Metallurgy 0 Active
US11662326B2 Method for calculating liquid-solid interface morphology during growth of ingot Chemistry; Metallurgy 0 Active
US11624123B2 Method and apparatus of monocrystal growth Chemistry; Metallurgy 0 Active
US9818844B2 High-voltage junctionless device with drift region and the method for making the same Electricity 0 Active
US12400917B2 Method for verification of conductivity type of silicon wafer Physics 0 Active
US10553496B2 Complementary metal-oxide-semiconductor field-effect transistor and method thereof Electricity 0 Active
US9779964B2 Thermal processing method for wafer Electricity 0 Active
US9634133B1 Method of forming fin structure on patterned substrate that includes depositing quantum well layer over fin structure Electricity 0 Active
US11427925B2 Apparatus and method for ingot growth Chemistry; Metallurgy 0 Active
US12107016B2 Detection method of metal impurity in wafer Emerging Cross-Sectional Technologies 0 Active
US11471997B2 Polishing pad, polishing apparatus and a method for polishing silicon wafer Electricity 0 Active

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.