Inventor · Tokyo, JP

Akio Ishikawa

37Patents
8h-index
39Co-inventors
75Inventor score

Filing activity: Sep 10, 1975 → Apr 26, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US8204316B2 Apparatus, method and computer program for classifying pixels in a motion picture as foreground or background Physics 24 Active
US6665690B2 System and method for determining respective lengths of recording units used for recording different types of data on disc medium Emerging Cross-Sectional Technologies 15 Expired
US5841185A Semiconductor device having CMOS transistors Electricity 15 Expired
US4019228A Crimping apparatus Textiles; Paper 14 Expired
US10109427B2 Layer compositions with improved electrical parameters comprising PEDOT/PSS and a stabilizer Emerging Cross-Sectional Technologies 14 Active
US5828120A Semiconductor device and production method thereof Electricity 13 Expired
US8422761B2 Defect and critical dimension analysis systems and methods for a semiconductor lithographic process Physics 10 Active
US8150140B2 System and method for a semiconductor lithographic process control using statistical information in defect identification Physics 9 Active
US7330581B2 Image defect inspection method, image defect inspection apparatus and appearance inspection apparatus Physics 8 Expired
US8311089B2 Multi-view video compression coding method and apparatus Electricity 6 Active
US7327871B2 Defect inspecting method, defect inspecting apparatus and inspection machine Physics 5 Active
US7096237B2 Recording and/or reproduction apparatus, file management method and providing medium Emerging Cross-Sectional Technologies 5 Expired
US6838413B2 Oxysulfide photocatalyst for decomposition of water by visible light Emerging Cross-Sectional Technologies 5 Expired
US8687000B2 Image generating apparatus and computer program Physics 5 Active
US8243122B2 Video method for generating free viewpoint video image using divided local regions Physics 4 Active
US7492942B2 Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus Physics 3 Expired
US5714787A Semiconductor device with a reduced element isolation region Electricity 3 Expired
US8428350B2 Color correction apparatus, method and computer program Electricity 2 Active
US7010504B2 Competitive buying and selling system and its control method Physics 2 Expired
US8548227B2 Image processing apparatus and computer program Physics 1 Active
US6356521B1 Information recording method and apparatus Physics 1 Expired
US6728175B2 Information recording method and apparatus Physics 1 Expired
US7346207B2 Image defect inspection method, image defect inspection apparatus, and appearance inspection apparatus Physics 1 Active
US7356249B2 Apparatus and method for recording/reproducing data, which enable reading of data recorded even when the apparatus stops due to a power failure Electricity 1 Expired
US11600449B2 Layer compositions with improved electrical parameters comprising PEDOT/PSS and a stabilizer Emerging Cross-Sectional Technologies 1 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.