April Gurba
7Patents
3h-index
10Co-inventors
43Inventor score
Filing activity: May 23, 2003 → Jan 24, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7560792B2 | Reliable high voltage gate dielectric layers using a dual nitridation process | Electricity | 4 | Active |
| US7049242B2 | Post high voltage gate dielectric pattern plasma surface treatment | Electricity | 3 | Expired |
| US7018925B2 | Post high voltage gate oxide pattern high-vacuum outgas surface treatment | Electricity | 3 | Expired |
| US7183165B2 | Reliable high voltage gate dielectric layers using a dual nitridation process | Electricity | 2 | Expired |
| US7339240B2 | Dual-gate integrated circuit semiconductor device | Electricity | 1 | Expired |
| US7087440B2 | Monitoring of nitrided oxide gate dielectrics by determination of a wet etch | Electricity | 0 | Expired |
| US7402524B2 | Post high voltage gate oxide pattern high-vacuum outgas surface treatment | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.