Inventor · Gdera, IL

Assaf Asbag

12Patents

2h-index

9Co-inventors

36Inventor score

Filing activity: Aug 24, 2017 → Aug 14, 2020

Most-cited inventions

Patent	Title	Area	Cited by	Status
US10832092B2	Method of generating a training set usable for examination of a semiconductor specimen and system thereof	Physics	6	Active
US10748271B2	Method of defect classification and system thereof	Physics	3	Active
US11138507B2	System, method and computer program product for classifying a multiplicity of items	Physics	2	Active
US11199506B2	Generating a training set usable for examination of a semiconductor specimen	Electricity	2	Active
US11568531B2	Method of deep learning-based examination of a semiconductor specimen and system thereof	Physics	1	Active
US11037286B2	Method of classifying defects in a semiconductor specimen and system thereof	Physics	1	Active
US10360669B2	System, method and computer program product for generating a training set for a classifier	Physics	1	Active
US11526979B2	Method of defect classification and system thereof	Physics	1	Active
US10921334B2	System, method and computer program product for classifying defects	Physics	0	Active
US10803575B2	System, method and computer program product for generating a training set for a classifier	Physics	0	Active
US11321633B2	Method of classifying defects in a specimen semiconductor examination and system thereof	Physics	0	Active
US11151706B2	Method of classifying defects in a semiconductor specimen and system thereof	Physics	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.