Chen Liu
17Patents
2h-index
34Co-inventors
50Inventor score
Filing activity: Jul 9, 2009 → Jan 13, 2025
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8436013B2 | Compounds and methods for treatment of alpha-1 antitrypsin deficiency | Human Necessities | 6 | Active |
| US8550336B2 | Systems and methods for anti-counterfeit authentication through communication networks | Emerging Cross-Sectional Technologies | 4 | Active |
| US8931689B2 | Systems and methods for anti-counterfeit authentication through communication networks | Emerging Cross-Sectional Technologies | 2 | Active |
| US11953455B1 | Ore component analysis device and method | Physics | 1 | Active |
| US11430768B2 | Stacked die chip package structure and method of manufacturing the same | Electricity | 1 | Active |
| US8354869B1 | Systems and methods for controlling power supply current using clock gating | Emerging Cross-Sectional Technologies | 0 | Active |
| US12175597B1 | Systems and methods for arranging clothing patterns | Physics | 0 | Active |
| US11340286B2 | On-wafer S-parameter calibration method | Physics | 0 | Active |
| US11275103B2 | Calibration method, system and device of on-wafer s parameter of vector network analyzer | Physics | 0 | Active |
| US10081542B2 | Nanozymes, methods of making nanozymes, and methods of using nanozymes | Human Necessities | 0 | Active |
| US11733298B2 | Two-port on-wafer calibration piece circuit model and method for determining parameters | Physics | 0 | Active |
| US11385175B2 | Calibration method and terminal equipment of terahertz frequency band on-wafer S parameter | Physics | 0 | Active |
| US12313574B1 | Coincidence technique-based x-ray detection device and composition analysis method | Emerging Cross-Sectional Technologies | 0 | Active |
| US10538757B2 | Nanozymes, methods of making nanozymes, and methods of using nanozymes | Chemistry; Metallurgy | 0 | Active |
| US12175620B1 | Systems and methods for arranging and displaying clothing patterns | Physics | 0 | Active |
| US11971451B2 | Method for determining parameters in on-wafer calibration piece model | Physics | 0 | Active |
| US12355932B2 | Methods and systems for personalized image generation | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.