Daniel I. Some
23Patents
6h-index
16Co-inventors
66Inventor score
Filing activity: Aug 16, 2000 → Feb 14, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6791099B2 | Laser scanning wafer inspection using nonlinear optical phenomena | Physics | 34 | Expired |
| US6853446B1 | Variable angle illumination wafer inspection system | Physics | 29 | Expired |
| US6686602B2 | Patterned wafer inspection using spatial filtering | Physics | 26 | Expired |
| US7009695B2 | Full frame thermal pump probe technique for detecting subsurface defects | Physics | 21 | Expired |
| US7006224B2 | Method and system for optical inspection of an object | Physics | 10 | Expired |
| US9146192B2 | Integrated light scattering and ultraviolet absorption measurement system | Physics | 7 | Active |
| US6943898B2 | Apparatus and method for dual spot inspection of repetitive patterns | Physics | 6 | Expired |
| US7359045B2 | High speed laser scanning inspection system | Physics | 5 | Expired |
| US8976353B2 | Multiwell plate lid for improved optical measurements | Physics | 4 | Active |
| US7693323B2 | Multi-detector defect detection system and a method for detecting defects | Physics | 3 | Expired |
| US7813882B2 | Method for determining average properties of molecules in solution | Physics | 3 | Active |
| US7027142B2 | Optical technique for detecting buried defects in opaque films | Physics | 3 | Expired |
| US8964177B2 | Method and apparatus to illuminate sample and containing vessel in a light scattering detector | Physics | 2 | Active |
| US7365836B2 | High speed laser scanning inspection system | Physics | 2 | Expired |
| US7433053B2 | Laser inspection using diffractive elements for enhancement and suppression of surface features | Physics | 1 | Expired |
| US12038376B2 | Purifying a sample solution via real-time multi-angle light scattering | Physics | 0 | Active |
| US11579079B2 | Differential refractometer for gradient chromatography | Physics | 0 | Active |
| US9347869B2 | Multiwell plate lid for improved optical measurements | Physics | 0 | Active |
| US7589835B2 | High speed laser scanning inspection system | Physics | 0 | Active |
| US12429464B2 | Differential refractometer for gradient chromatography | Physics | 0 | Active |
| US8195405B2 | Method for characterizing reversible association of macromolecules at high concentration | Physics | 0 | Active |
| US12135316B2 | Controlling the purification of a macromolecule solution via real-time multi-angle light scattering | Physics | 0 | Active |
| US12085495B2 | Calculating molar mass values of components of and molar mass concentration values of conjugate molecules/particles | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.