Dmitry Klochkov
7Patents
0h-index
9Co-inventors
24Inventor score
Filing activity: Oct 7, 2021 → Apr 26, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US12288706B2 | Parameterizing x-ray scattering measurement using slice-and-image tomographic imaging of semiconductor structures | Physics | 0 | Active |
| US11848172B2 | Method for measuring a sample and microscope implementing the method | Electricity | 0 | Active |
| US12056865B2 | Wafer-tilt determination for slice-and-image process | Electricity | 0 | Active |
| US12148139B2 | Methods and evaluation devices for analyzing three-dimensional data sets representing devices | Physics | 0 | Active |
| US12288705B2 | FIB-SEM 3D tomography for measuring shape deviations of HAR structures | Electricity | 0 | Active |
| US12283504B2 | Contact area size determination between 3D structures in an integrated semiconductor sample | Physics | 0 | Active |
| US11915908B2 | Method for measuring a sample and microscope implementing the method | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.