Faye D. Baker
9Patents
6h-index
23Co-inventors
59Inventor score
Filing activity: Jun 24, 1996 → Dec 23, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7503020B2 | IC layout optimization to improve yield | Physics | 107 | Active |
| US7823106B2 | Variable performance ranking and modification in design for manufacturability of circuits | Emerging Cross-Sectional Technologies | 25 | Active |
| US5874318A | Dishing and erosion monitor structure for damascene metal processing | Electricity | 24 | Expired |
| US5861330A | Method and structure to reduce latch-up using edge implants | Emerging Cross-Sectional Technologies | 24 | Expired |
| US5723874A | Dishing and erosion monitor structure for damascene metal processing | Electricity | 13 | Expired |
| US6033949A | Method and structure to reduce latch-up using edge implants | Emerging Cross-Sectional Technologies | 7 | Expired |
| US6670283B2 | Backside protection films | Electricity | 6 | Expired |
| US6232639A | Method and structure to reduce latch-up using edge implants | Emerging Cross-Sectional Technologies | 6 | Expired |
| US7818694B2 | IC layout optimization to improve yield | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.