Fernando Guarin
10Patents
8h-index
18Co-inventors
69Inventor score
Filing activity: Jan 30, 1995 → Jun 28, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6476632B1 | Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring | Physics | 108 | Expired |
| US5667586A | Method for forming a single crystal semiconductor on a substrate | Emerging Cross-Sectional Technologies | 48 | Expired |
| US6521469B1 | Line monitoring of negative bias temperature instabilities by hole injection methods | Electricity | 31 | Expired |
| US6456104B1 | Method and structure for in-line monitoring of negative bias temperature instability in field effect transistors | Physics | 26 | Expired |
| US5563428A | Layered structure of a substrate, a dielectric layer and a single crystal layer | Emerging Cross-Sectional Technologies | 20 | Expired |
| US7723824B2 | Methodology for recovery of hot carrier induced degradation in bipolar devices | Electricity | 16 | Active |
| US8159814B2 | Method of operating transistors and structures thereof for improved reliability and lifetime | Electricity | 9 | Active |
| US10126354B1 | Assessment of HCI in logic circuits based on AC stress in discrete FETs | Electricity | 8 | Active |
| US6958621B2 | Method and circuit for element wearout recovery | Electricity | 5 | Expired |
| US7238565B2 | Methodology for recovery of hot carrier induced degradation in bipolar devices | Electricity | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.