Hiroshi Hamana
18Patents
12h-index
29Co-inventors
78Inventor score
Filing activity: Feb 6, 1986 → Nov 9, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9378969B2 | Low temperature gas-phase carbon removal | Electricity | 509 | Active |
| US8664127B2 | Two silicon-containing precursors for gapfill enhancing dielectric liner | Electricity | 463 | Active |
| US9153442B2 | Processing systems and methods for halide scavenging | Electricity | 217 | Active |
| US9023732B2 | Processing systems and methods for halide scavenging | Electricity | 184 | Active |
| US9093371B2 | Processing systems and methods for halide scavenging | Electricity | 183 | Active |
| US9184055B2 | Processing systems and methods for halide scavenging | Electricity | 178 | Active |
| US9449850B2 | Processing systems and methods for halide scavenging | Electricity | 134 | Active |
| US9659792B2 | Processing systems and methods for halide scavenging | Electricity | 121 | Active |
| US9704723B2 | Processing systems and methods for halide scavenging | Electricity | 114 | Active |
| US9991134B2 | Processing systems and methods for halide scavenging | Electricity | 100 | Active |
| US8365934B2 | Synthetic resin cap | Performing Operations; Transporting | 12 | Active |
| US4613657A | Method for anionic homopolymerization of .alpha.-trifluoromethylacrylate | Chemistry; Metallurgy | 12 | Expired |
| US8297458B2 | Cap and container for improved sealing | Performing Operations; Transporting | 5 | Active |
| US8975152B2 | Methods of reducing substrate dislocation during gapfill processing | Electricity | 4 | Active |
| US8476142B2 | Preferential dielectric gapfill | Electricity | 2 | Active |
| US5308888A | Fluorine-containing curable resin composition and use thereof | Electricity | 1 | Expired |
| US8012887B2 | Precursor addition to silicon oxide CVD for improved low temperature gapfill | Electricity | 0 | Active |
| US10533204B2 | Method for amplifying a T cell receptor (TCR) cDNA | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.