Hiroya Shimizu
21Patents
7h-index
31Co-inventors
65Inventor score
Filing activity: Jan 27, 1997 → Sep 13, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6211576A | Semiconductor device | Electricity | 36 | Expired |
| US5838549A | Memory module and an IC card | Emerging Cross-Sectional Technologies | 29 | Expired |
| US7823096B2 | Inductance analysis system and method and program therefor | Electricity | 12 | Active |
| US6326699A | Semiconductor device | Electricity | 9 | Expired |
| US6531785B2 | Semiconductor device | Electricity | 8 | Expired |
| US6828810B2 | Semiconductor device testing apparatus and method for manufacturing the same | Physics | 7 | Expired |
| US6864568B2 | Packaging device for holding a plurality of semiconductor devices to be inspected | Electricity | 7 | Expired |
| US6784533B2 | Semiconductor device | Electricity | 5 | Expired |
| US7345892B2 | Semiconductor device, noise reduction method, and shield cover | Electricity | 5 | Expired |
| US6614246B1 | Probe structure | Physics | 4 | Expired |
| US7119446B2 | Semiconductor device | Electricity | 4 | Expired |
| US6864695B2 | Semiconductor device testing apparatus and semiconductor device manufacturing method using it | Physics | 3 | Expired |
| US6955870B2 | Method of manufacturing a semiconductor device | Physics | 3 | Expired |
| US6882039B2 | Semiconductor device | Electricity | 3 | Expired |
| US6952110B2 | Testing apparatus for carrying out inspection of a semiconductor device | Physics | 2 | Expired |
| US6977514B2 | Probe structure | Physics | 2 | Expired |
| US6465264B1 | Method for producing semiconductor device and apparatus usable therein | Physics | 1 | Expired |
| US7030478B2 | Semiconductor device | Electricity | 1 | Expired |
| US7681154B2 | Method for designing device, system for aiding to design device, and computer program product therefor | Physics | 1 | Active |
| US8362614B2 | Fine pitch grid array type semiconductor device | Electricity | 1 | Active |
| US6885208B2 | Semiconductor device and test device for same | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.