James Michael Hammond
17Patents
12h-index
16Co-inventors
67Inventor score
Filing activity: Jun 12, 1992 → Jun 29, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5804982A | Miniature probe positioning actuator | Physics | 108 | Expired |
| US6169281A | Apparatus and method for determining side wall profiles using a scanning probe microscope having a probe dithered in lateral directions | Emerging Cross-Sectional Technologies | 45 | Expired |
| US5262643A | Automatic tip approach method and apparatus for scanning probe microscope | Emerging Cross-Sectional Technologies | 45 | Expired |
| US6093930A | Automatic probe replacement in a scanning probe microscope | Emerging Cross-Sectional Technologies | 29 | Expired |
| US5902928A | Controlling engagement of a scanning microscope probe with a segmented piezoelectric actuator | Emerging Cross-Sectional Technologies | 20 | Expired |
| US6079254A | Scanning force microscope with automatic surface engagement and improved amplitude demodulation | Emerging Cross-Sectional Technologies | 19 | Expired |
| US5918274A | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Emerging Cross-Sectional Technologies | 15 | Expired |
| US5635848A | Method and system for controlling high-speed probe actuators | Physics | 14 | Expired |
| US5360974A | Dual quad flexure scanner | Physics | 13 | Expired |
| US6318159A | Scanning force microscope with automatic surface engagement | Emerging Cross-Sectional Technologies | 12 | Expired |
| US5550483A | High speed test probe positioning system | Physics | 12 | Expired |
| US6220084A | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Emerging Cross-Sectional Technologies | 12 | Expired |
| US5635849A | Miniature probe positioning actuator | Physics | 8 | Expired |
| US5260577A | Sample carriage for scanning probe microscope | Emerging Cross-Sectional Technologies | 7 | Expired |
| US5532611A | Miniature probe positioning actuator | Physics | 7 | Expired |
| US6167753A | Detecting fields with a single-pass, dual-amplitude-mode scanning force microscope | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6234009A | Controlling motion of a scanning force microscope probe tip moving into engagement with a sample surface | Emerging Cross-Sectional Technologies | 2 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.