James Misewich
15Patents
10h-index
18Co-inventors
61Inventor score
Filing activity: Nov 19, 1997 → Mar 17, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6744087B2 | Non-volatile memory using ferroelectric gate field-effect transistors | Electricity | 48 | Expired |
| US6365913B1 | Dual gate field effect transistor utilizing Mott transition materials | Electricity | 25 | Expired |
| US6426536B1 | Double layer perovskite oxide electrodes | Electricity | 24 | Expired |
| US7115916B2 | System and method for molecular optical emission | Emerging Cross-Sectional Technologies | 20 | Expired |
| US5984478A | Dynamic optical compensation for color sequential projection display | Physics | 20 | Expired |
| US7183568B2 | Piezoelectric array with strain dependant conducting elements and method therefor | Physics | 16 | Expired |
| US6333543A | Field-effect transistor with a buried mott material oxide channel | Electricity | 16 | Expired |
| US6555393B2 | Process for fabricating a field-effect transistor with a buried Mott material oxide channel | Electricity | 11 | Expired |
| US5920086A | Light emitting device | Electricity | 11 | Expired |
| US6259114A | Process for fabrication of an all-epitaxial-oxide transistor | Electricity | 10 | Expired |
| US6350622B2 | Process for fabrication of an all-epitaxial-oxide transistor | Electricity | 10 | Expired |
| US6562633B2 | Assembling arrays of small particles using an atomic force microscope to define ferroelectric domains | Emerging Cross-Sectional Technologies | 7 | Expired |
| US7002646B2 | Tunable thin film optical devices and fabrication methods for tunable thin film optical devices | Physics | 2 | Expired |
| US6479847B2 | Method for complementary oxide transistor fabrication | Electricity | 1 | Expired |
| US6527856B2 | Method for changing surface termination of a perovskite oxide substrate surface | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.