Inventor · Union City, CA, US

Janet M. Flanner

16Patents
12h-index
15Co-inventors
71Inventor score

Filing activity: Aug 27, 1987 → Dec 4, 2002

Most-cited inventions

PatentTitleAreaCited byStatus
US6241845A Apparatus for reducing process drift in inductive coupled plasma etching such as oxide layer Electricity 232 Expired
US4987099A Method for selectively filling contacts or vias or various depths with CVD tungsten Electricity 81 Expired
US6696366B1 Technique for etching a low capacitance dielectric layer Electricity 56 Expired
US4822749A Self-aligned metallization for semiconductor device and process using selectively deposited tungsten Emerging Cross-Sectional Technologies 45 Expired
US6426304B1 Post etch photoresist strip with hydrogen for organosilicate glass low-&kgr; etch applications Physics 40 Expired
US6114250A Techniques for etching a low capacitance dielectric layer on a substrate Electricity 33 Expired
US6410437B1 Method for etching dual damascene structures in organosilicate glass Electricity 33 Expired
US6383931B1 Convertible hot edge ring to improve low-K dielectric etch Electricity 33 Expired
US6048798A Apparatus for reducing process drift in inductive coupled plasma etching such as oxide layer Electricity 33 Expired
US5783496A Methods and apparatus for etching self-aligned contacts Electricity 24 Expired
US6653734B2 Convertible hot edge ring to improve low-K dielectric etch Electricity 21 Expired
US6165910A Self-aligned contacts for semiconductor device Electricity 12 Expired
US6133153A Self-aligned contacts for semiconductor device Electricity 9 Expired
US5021358A Semiconductor fabrication process using sacrificial oxidation to reduce tunnel formation during tungsten deposition Electricity 4 Expired
US6946303B2 Electronically diagnosing a component in a process line using a substrate signature Physics 2 Expired
US6890774B2 System and method for creating a substrate signature Electricity 1 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.