Jing Su
15Patents
2h-index
29Co-inventors
46Inventor score
Filing activity: Apr 29, 2016 → Aug 14, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10670973B2 | Coloring aware optimization | Physics | 6 | Active |
| US11561477B2 | Training methods for machine learning assisted optical proximity error correction | Physics | 2 | Active |
| US11443083B2 | Identification of hot spots or defects by machine learning | Physics | 2 | Active |
| US11232249B2 | Method for determining curvilinear patterns for patterning device | Physics | 2 | Active |
| US11768440B2 | Training methods for machine learning assisted optical proximity error correction | Physics | 1 | Active |
| US10326250B2 | Method for expanding tuning range of all-solid-state continuous-wave single frequency laser | Electricity | 1 | Active |
| US11127160B2 | Object characteristic locating device and laser and imaging integration system | Physics | 0 | Active |
| US11734490B2 | Method for determining curvilinear patterns for patterning device | Physics | 0 | Active |
| US12204250B2 | Training methods for machine learning assisted optical proximity error | Physics | 0 | Active |
| US12360461B2 | Identification of hot spots or defects by machine learning | Physics | 0 | Active |
| US12038694B2 | Determining pattern ranking based on measurement feedback from printed substrate | Physics | 0 | Active |
| US12399423B2 | Method for training machine learning model to determine optical proximity correction for mask | Physics | 0 | Active |
| US11635699B2 | Determining pattern ranking based on measurement feedback from printed substrate | Physics | 0 | Active |
| US11404840B2 | Device and method for measuring thermal load caused by excited state absorption in laser gain crystal | Electricity | 0 | Active |
| US11916349B2 | Device and method for measuring thermal load caused by energy transfer upconversion in laser gain crystal | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.