Jiro Sawada
16Patents
8h-index
43Co-inventors
72Inventor score
Filing activity: Apr 25, 1988 → Jan 9, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5910010A | Semiconductor integrated circuit device, and process and apparatus for manufacturing the same | Electricity | 81 | Expired |
| US5579256A | Semiconductor memory device and defect remedying method thereof | Emerging Cross-Sectional Technologies | 34 | Expired |
| US5151881A | Semiconductor memory including an arrangement to permit external monitoring of an internal control signal | Physics | 27 | Expired |
| US5602771A | Semiconductor memory device and defect remedying method thereof | Electricity | 27 | Expired |
| US6049500A | Semiconductor memory device and defect remedying method thereof | Electricity | 16 | Expired |
| US6515913B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 12 | Expired |
| US6160744A | Semiconductor memory device and defect remedying method thereof | Electricity | 11 | Expired |
| US6212089A | Semiconductor memory device and defect remedying method thereof | Electricity | 10 | Expired |
| US5854508A | Semiconductor memory device having zigzag bonding pad arrangement | Emerging Cross-Sectional Technologies | 8 | Expired |
| US6657901B2 | Semiconductor device formed in a rectangle region on a semiconductor substrate including a voltage generating circuit | Electricity | 6 | Expired |
| US6335884B1 | Semiconductor memory device and defect remedying method thereof | Electricity | 6 | Expired |
| US7499340B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 4 | Active |
| US6898130B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 4 | Expired |
| US7203101B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 4 | Expired |
| US7345929B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 2 | Active |
| US7016236B2 | Semiconductor memory device and defect remedying method thereof | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.