Juying Dou
17Patents
5h-index
30Co-inventors
62Inventor score
Filing activity: May 30, 2008 → Jun 30, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9922799B2 | Apparatus of plural charged-particle beams | Electricity | 40 | Active |
| US7960697B2 | Electron beam apparatus | Electricity | 19 | Active |
| US9991147B2 | Wafer grounding and biasing method, apparatus, and application | Electricity | 14 | Active |
| US7759653B2 | Electron beam apparatus | Electricity | 11 | Active |
| US8908348B2 | Wafer grounding and biasing method, apparatus, and application | Electricity | 7 | Active |
| US8094428B2 | Wafer grounding methodology | Electricity | 5 | Active |
| US10541110B2 | Apparatus of plural charged-particle beams | Electricity | 4 | Active |
| US8218284B2 | Apparatus for increasing electric conductivity to a semiconductor wafer substrate when exposure to electron beam | Emerging Cross-Sectional Technologies | 3 | Active |
| US8896195B2 | Filament for electron source | Electricity | 2 | Active |
| US11705304B2 | Apparatus of plural charged-particle beams | Electricity | 1 | Active |
| US11062877B2 | Apparatus of plural charged-particle beams | Electricity | 1 | Active |
| US10784071B2 | Electron emitter and method of fabricating same | Electricity | 0 | Active |
| US11201032B2 | Electron emitter and method of fabricating same | Electricity | 0 | Active |
| US12051562B2 | Method, apparatus, and system for wafer grounding | Electricity | 0 | Active |
| US12424408B2 | Apparatus of plural charged-particle beams | Electricity | 0 | Active |
| US8022609B2 | Thermal field emission cathode | Electricity | 0 | Active |
| US11688579B2 | Electron emitter and method of fabricating same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.