Ken Murayama
18Patents
10h-index
31Co-inventors
72Inventor score
Filing activity: Jan 14, 1976 → Sep 3, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5128408A | Gas-permeable material with excellent compatibility with blood | Chemistry; Metallurgy | 98 | Expired |
| US6229607A | Fine movement mechanism unit and scanning probe microscope | Emerging Cross-Sectional Technologies | 59 | Expired |
| US6329337A | Adhesive for biological tissue | Human Necessities | 35 | Expired |
| US5965881A | Scanning probe microscope and processing apparatus | Emerging Cross-Sectional Technologies | 15 | Expired |
| US6278113A | Scanning probe microscope | Emerging Cross-Sectional Technologies | 15 | Expired |
| US4086208A | Flame resistant polyesters | Chemistry; Metallurgy | 14 | Expired |
| US4478961A | Polyvinyl chloride composition | Emerging Cross-Sectional Technologies | 13 | Expired |
| US5005298A | Displacement controller for fine positioning device | Physics | 12 | Expired |
| US4888878A | Fine positioning device | Physics | 11 | Expired |
| US4511878A | Pressure sensor with improved semiconductor diaphragm | Emerging Cross-Sectional Technologies | 10 | Expired |
| US4465480A | Blood transfusion tubes and devices for use in contact with human blood | Human Necessities | 8 | Expired |
| US4991309A | Fine positioning device and displacement controller therefor | Physics | 7 | Expired |
| US4920660A | Fine positioning device and displacement controller therefor | Physics | 7 | Expired |
| US7333191B2 | Scanning probe microscope and measurement method using the same | Physics | 5 | Expired |
| US6184533A | Scanning probe microscope with the stage unit | Emerging Cross-Sectional Technologies | 4 | Expired |
| US7388199B2 | Probe manufacturing method, probe, and scanning probe microscope | Physics | 3 | Expired |
| US7350404B2 | Scanning type probe microscope and probe moving control method therefor | Emerging Cross-Sectional Technologies | 1 | Expired |
| US6745617B2 | Scanning probe microscope | Emerging Cross-Sectional Technologies | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.