Michael S. Darsillo
15Patents
9h-index
22Co-inventors
68Inventor score
Filing activity: Jul 31, 1992 → Sep 19, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7300601B2 | Passivative chemical mechanical polishing composition for copper film planarization | Electricity | 30 | Expired |
| US7736405B2 | Chemical mechanical polishing compositions for copper and associated materials and method of using same | Electricity | 22 | Expired |
| US8304344B2 | High throughput chemical mechanical polishing composition for metal film planarization | Electricity | 22 | Active |
| US6284819A | Recording medium | Emerging Cross-Sectional Technologies | 22 | Expired |
| US5827363A | Structure precipitated silicates and silicas, production and use in ink jet printing | Chemistry; Metallurgy | 21 | Expired |
| US6420039B1 | Recording medium | Emerging Cross-Sectional Technologies | 18 | Expired |
| US7361603B2 | Passivative chemical mechanical polishing composition for copper film planarization | Electricity | 18 | Expired |
| US6365264B2 | Recording medium | Emerging Cross-Sectional Technologies | 10 | Expired |
| US5317053A | Method for production of high solid aqueous calcium carbonate suspensions | Chemistry; Metallurgy | 10 | Expired |
| US6964992B2 | Ink jet recording medium comprising amine-treated silica | Emerging Cross-Sectional Technologies | 7 | Expired |
| US6861115B2 | Ink jet recording medium comprising amine-treated silica | Emerging Cross-Sectional Technologies | 6 | Expired |
| US8236695B2 | Method of passivating chemical mechanical polishing compositions for copper film planarization processes | Electricity | 5 | Active |
| US6887559B1 | Recording medium | Emerging Cross-Sectional Technologies | 3 | Expired |
| US7431993B2 | Recording medium with glossy coating containing alumina | Emerging Cross-Sectional Technologies | 1 | Expired |
| US8142843B2 | Aerogel particles and methods of making same | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.