Inventor · Los Gatos, CA, US

Nader Pakdaman

20Patents
14h-index
12Co-inventors
70Inventor score

Filing activity: Nov 28, 2001 → Jun 1, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US7256055B2 System and apparatus for using test structures inside of a chip during the fabrication of the chip Electricity 108 Expired
US7736916B2 System and apparatus for using test structures inside of a chip during the fabrication of the chip Electricity 93 Active
US8344745B2 Test structures for evaluating a fabrication of a die or a wafer Electricity 88 Active
US6621275B2 Time resolved non-invasive diagnostics system Physics 68 Expired
US8990759B2 Contactless technique for evaluating a fabrication of a wafer Electricity 59 Active
US6859031B2 Apparatus and method for dynamic diagnostic testing of integrated circuits Physics 44 Expired
US6594086B1 Bi-convex solid immersion lens Physics 33 Expired
US6836131B2 Spray cooling and transparent cooling plate thermal management system Physics 33 Expired
US7220990B2 Technique for evaluating a fabrication of a die and wafer Electricity 30 Expired
US6778327B2 Bi-convex solid immersion lens Physics 20 Expired
US7224828B2 Time resolved non-invasive diagnostics system Physics 19 Expired
US7423288B2 Technique for evaluating a fabrication of a die and wafer Electricity 14 Active
US7605597B2 Intra-chip power and test signal generation for use with test structures on wafers Electricity 14 Active
US7730434B2 Contactless technique for evaluating a fabrication of a wafer Electricity 14 Active
US7339388B2 Intra-clip power and test signal generation for use with test structures on wafers Electricity 11 Expired
US7492529B2 Bi-convex solid immersion lens Physics 8 Active
US7227702B2 Bi-convex solid immersion lens Physics 6 Expired
US7466852B2 Time resolved non-invasive diagnostics system Physics 5 Active
US8410568B2 Integrated photodiode for semiconductor substrates Electricity 3 Active
US7723724B2 System for using test structures to evaluate a fabrication of a wafer Electricity 2 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.