Nan-Chun Lien
19Patents
4h-index
27Co-inventors
56Inventor score
Filing activity: May 13, 2009 → Feb 16, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9336865B1 | Multi-port SRAM module and control method thereof | Physics | 15 | Active |
| US9299421B1 | Static random access memory and method thereof | Physics | 11 | Active |
| US9728250B2 | Memory write tracking device and method | Physics | 6 | Active |
| US8804445B2 | Oscillato based on a 6T SRAM for measuring the bias temperature instability | Physics | 4 | Active |
| US9496014B2 | Random access memory and memory access method thereof | Physics | 3 | Active |
| US9870817B2 | SRAM module and writing control method thereof | Physics | 3 | Active |
| US9213789B2 | Method of generating optimized memory instances using a memory compiler | Physics | 3 | Active |
| US8582378B1 | Threshold voltage measurement device | Physics | 2 | Active |
| US7868668B2 | Power-on detector and method thereof | Electricity | 2 | Active |
| US11935581B2 | Circuit module with reliable margin configuration | Physics | 1 | Active |
| US10074418B2 | SRAM module and writing control method thereof | Physics | 0 | Active |
| US10014035B2 | Control device for controlling semiconductor memory device | Physics | 0 | Active |
| US9159403B2 | Control circuit of SRAM and operating method thereof | Physics | 0 | Active |
| US12205635B2 | Memory module with improved timing adaptivity of sensing amplification | Electricity | 0 | Active |
| US8854897B2 | Static random access memory apparatus and bit-line voltage controller thereof | Physics | 0 | Active |
| US12293785B2 | Circuit module with reliable margin configuration | Physics | 0 | Active |
| US9378808B2 | Pulse width modulation device | Physics | 0 | Active |
| US12080368B2 | Circuit module with improved line load | Physics | 0 | Active |
| US11742000B2 | Circuit module with improved line load | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.