Nicholas Bottka
15Patents
9h-index
14Co-inventors
65Inventor score
Filing activity: Apr 28, 1975 → Jun 17, 1992
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US4454835A | Internal photolysis reactor | Chemistry; Metallurgy | 63 | Expired |
| US5379109A | Method and apparatus for non-destructively measuring local resistivity of semiconductors | Electricity | 36 | Expired |
| US5365334A | Micro photoreflectance semiconductor wafer analyzer | Electricity | 22 | Expired |
| US4403397A | Method of making avalanche photodiodes | Emerging Cross-Sectional Technologies | 19 | Expired |
| US3973216A | Laser with a high frequency rate of modulation | Electricity | 17 | Expired |
| US4953983A | Non-destructively measuring local carrier concentration and gap energy in a semiconductor | Physics | 15 | Expired |
| US4144540A | Tunable infrared detector with narrow bandwidth | Electricity | 11 | Expired |
| US3976873A | Tunable electroabsorptive detector | Physics | 11 | Expired |
| US4524090A | Deposition of compounds from multi-component organo-metals | Chemistry; Metallurgy | 9 | Expired |
| US4508590A | Method for the deposition of high-quality crystal epitaxial films of iron | Chemistry; Metallurgy | 7 | Expired |
| US4218143A | Lattice matching measurement device | Physics | 7 | Expired |
| US3995155A | Integrated optical data bus coupler | Physics | 5 | Expired |
| US4316206A | Two color narrow bandwidth detector | Electricity | 4 | Expired |
| US4492434A | Multi-color tunable semiconductor device | Electricity | 4 | Expired |
| US4350413A | Multi-color tunable filter | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.