Peter Nunan
13Patents
7h-index
14Co-inventors
59Inventor score
Filing activity: May 25, 1999 → Sep 28, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6861666B1 | Apparatus and methods for determining and localization of failures in test structures using voltage contrast | Physics | 99 | Expired |
| US7820460B2 | Patterned assembly for manufacturing a solar cell and a method thereof | Emerging Cross-Sectional Technologies | 26 | Active |
| US6855568B2 | Apparatus and methods for monitoring self-aligned contact arrays using voltage contrast inspection | Physics | 14 | Expired |
| US6355979B2 | Hard mask for copper plasma etch | Electricity | 10 | Expired |
| US8222053B2 | Patterned assembly for manufacturing a solar cell and a method thereof | Emerging Cross-Sectional Technologies | 8 | Active |
| US7151018B1 | Method and apparatus for transistor sidewall salicidation | Electricity | 8 | Expired |
| US8470616B2 | Patterned assembly for manufacturing a solar cell and a method thereof | Emerging Cross-Sectional Technologies | 7 | Active |
| US6797640B2 | Method of utilizing hard mask for copper plasma etch | Electricity | 7 | Expired |
| US7820527B2 | Cleave initiation using varying ion implant dose | Electricity | 2 | Active |
| US9773921B2 | Combo amorphous and LTPS transistors | Electricity | 1 | Active |
| US7939424B2 | Wafer bonding activated by ion implantation | Electricity | 1 | Active |
| US7619229B2 | Technique for matching performance of ion implantation devices using an in-situ mask | Electricity | 1 | Active |
| US8461552B2 | Active particle trapping for process control | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.