Qiuyi Ye
13Patents
6h-index
14Co-inventors
59Inventor score
Filing activity: Sep 30, 1991 → Dec 22, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5335219A | Homogeneous composition of microcrystalline semiconductor material, semiconductor devices and directly overwritable memory elements fabricated therefrom, and arrays fabricated from the memory elements | Physics | 371 | Expired |
| US5406509A | Electrically erasable, directly overwritable, multibit single cell memory elements and arrays fabricated therefrom | Physics | 231 | Expired |
| US7376001B2 | Row circuit ring oscillator method for evaluating memory cell performance | Physics | 66 | Expired |
| US7301835B2 | Internally asymmetric methods and circuits for evaluating static memory cell dynamic stability | Physics | 59 | Expired |
| US7304895B2 | Bitline variable methods and circuits for evaluating static memory cell dynamic stability | Physics | 11 | Active |
| US7483322B2 | Ring oscillator row circuit for evaluating memory cell performance | Physics | 8 | Active |
| US6908815B2 | Dual work function semiconductor structure with borderless contact and method of fabricating the same | Electricity | 4 | Expired |
| US7561483B2 | Internally asymmetric method for evaluating static memory cell dynamic stability | Physics | 3 | Active |
| US7015552B2 | Dual work function semiconductor structure with borderless contact and method of fabricating the same | Electricity | 3 | Expired |
| US6528855B2 | MOSFET having a low aspect ratio between the gate and the source/drain | Electricity | 2 | Expired |
| US7558136B2 | Internally asymmetric methods and circuits for evaluating static memory cell dynamic stability | Physics | 1 | Active |
| US7515491B2 | Method for evaluating leakage effects on static memory cell access time | Physics | 1 | Active |
| US6642584B2 | Dual work function semiconductor structure with borderless contact and method of fabricating the same | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.