Inventor · Icheon-si, KR

Sam Young Kim

11Patents
2h-index
14Co-inventors
51Inventor score

Filing activity: Apr 1, 2002 → Sep 15, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US6842028B2 Apparatus for testing reliability of interconnection in integrated circuit Physics 11 Expired
US6693446B2 Apparatus for testing reliability of interconnection in integrated circuit Electricity 11 Expired
US7314853B2 Cleaning solution for photoresist and method for forming pattern using the same Chemistry; Metallurgy 2 Active
US7781145B2 Method for forming a photoresist pattern Chemistry; Metallurgy 2 Active
US7288364B2 Top anti-reflective coating composition and method for pattern formation of semiconductor device using the same Electricity 2 Expired
US6690187B2 Apparatus for testing reliability of interconnection in integrated circuit Physics 2 Expired
US7419760B2 Top anti-reflective coating composition, method for forming the pattern of a semiconductor device using the same, and semiconductor device comprising the pattern Emerging Cross-Sectional Technologies 0 Active
US11918521B2 Foldable ramp Human Necessities 0 Active
US7364837B2 Method for pattern formation using photoresist cleaning solution Physics 0 Active
US11821213B2 Block-type prefabricated ramp Emerging Cross-Sectional Technologies 0 Active
US7132217B2 Organic anti-reflective coating composition and pattern forming method using the same Emerging Cross-Sectional Technologies 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.