Shigeru Matsui
88Patents
14h-index
64Co-inventors
87Inventor score
Filing activity: Oct 28, 1975 → Apr 24, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7761246B2 | Surface inspection method and surface inspection apparatus | Physics | 96 | Active |
| US5179733A | Wristwatch band with radio antenna | Electricity | 54 | Expired |
| US6157444A | Defect inspection apparatus for silicon wafer | Physics | 48 | Expired |
| US4727325A | NMR imaging method | Physics | 30 | Expired |
| US4079651A | Touch response sensor for an electronic musical instrument | Emerging Cross-Sectional Technologies | 28 | Expired |
| US6384909B2 | Defect inspection method and apparatus for silicon wafer | Physics | 25 | Expired |
| US4757168A | Decorative improved switching apparatus having a rocking element | Electricity | 24 | Expired |
| US6256092A | Defect inspection apparatus for silicon wafer | Physics | 19 | Expired |
| US6160615A | Surface measurement apparatus for detecting crystal defects of wafer | Physics | 18 | Expired |
| US7457455B2 | Pattern defect inspection method and apparatus | Physics | 16 | Active |
| US5152693A | Clasp to join straps containing an antenna for a portable information device | Emerging Cross-Sectional Technologies | 15 | Expired |
| US6792359B2 | Method for inspecting defect and system therefor | Electricity | 15 | Expired |
| US6226079A | Defect assessing apparatus and method, and semiconductor manufacturing method | Physics | 15 | Expired |
| US6108079A | Method for measuring crystal defect and equipment using the same | Electricity | 14 | Expired |
| US6191849A | Wafer inspecting apparatus | Physics | 14 | Expired |
| US4733188A | NMR imaging method | Physics | 13 | Expired |
| US6118742A | Disk-rotation control apparatus | Physics | 13 | Expired |
| US4777443A | Inspection apparatus based on nuclear magnetic resonance | Physics | 12 | Expired |
| US4797616A | High speed NMR spectroscopic imaging method | Physics | 11 | Expired |
| US4716369A | High speed imaging method with three-dimensional NMR | Physics | 11 | Expired |
| US7710557B2 | Surface defect inspection method and apparatus | Physics | 10 | Active |
| US5557404A | Spectrophotometer with a system for calibrating a monochromator | Physics | 10 | Expired |
| US4625170A | NMR imaging method and apparatus | Physics | 9 | Expired |
| US6421308B1 | State detecting device and optical disk device | Physics | 8 | Expired |
| US7719669B2 | Surface inspection method and surface inspection apparatus | Electricity | 7 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.