Stan Stokowski
11Patents
8h-index
15Co-inventors
61Inventor score
Filing activity: Mar 7, 2002 → May 6, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7123356B1 | Methods and systems for inspecting reticles using aerial imaging and die-to-database detection | Physics | 75 | Expired |
| US7379175B1 | Methods and systems for reticle inspection and defect review using aerial imaging | Physics | 60 | Expired |
| US7027143B1 | Methods and systems for inspecting reticles using aerial imaging at off-stepper wavelengths | Physics | 59 | Expired |
| US7738093B2 | Methods for detecting and classifying defects on a reticle | Physics | 35 | Active |
| US6844927B2 | Apparatus and methods for removing optical abberations during an optical inspection | Physics | 23 | Expired |
| US6922236B2 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Physics | 15 | Expired |
| US6727512B2 | Method and system for detecting phase defects in lithographic masks and semiconductor wafers | Physics | 14 | Expired |
| US7133119B1 | Systems for simulating high NA and polarization effects in aerial images | Physics | 13 | Expired |
| US8194240B1 | Enhanced focusing capability on a sample using a spot matrix | Physics | 7 | Active |
| US6646281B1 | Differential detector coupled with defocus for improved phase defect sensitivity | Physics | 7 | Expired |
| US7738092B1 | System and method for reducing speckle noise in die-to-die inspection systems | Physics | 3 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.