Inventor · Walterboro, SC, US

Stephen H. Jones

18Patents
8h-index
23Co-inventors
72Inventor score

Filing activity: Mar 20, 1981 → Feb 17, 2010

Most-cited inventions

PatentTitleAreaCited byStatus
US5754294A Optical micrometer for measuring thickness of transparent wafers Physics 45 Expired
US5674778A Method of manufacturing an optoelectronic circuit including heterojunction bipolar transistor, laser and photodetector Electricity 40 Expired
US6690182B2 Embeddable corrosion monitoring-instrument for steel reinforced structures Physics 39 Expired
US5959731A Optical micrometer for measuring thickness of transparent substrates based on optical absorption Physics 26 Expired
US6237399A Cantilever having sensor system for independent measurement of force and torque Emerging Cross-Sectional Technologies 24 Expired
US5535231A Optoelectronic circuit including heterojunction bipolar transistor laser and photodetector Electricity 16 Expired
US6057924A Optical system for measuring and inspecting partially transparent substrates Physics 14 Expired
US9020367B2 Optical chips and devices for optical communications Physics 12 Active
US4338769A Oven regulator for a skin packaging machine Performing Operations; Transporting 8 Expired
US4472921A Control arrangement for skin packaging machine Performing Operations; Transporting 5 Expired
US4413172A Method of heat control in a skin packaging machine Performing Operations; Transporting 5 Expired
US4514758A Fall velocity indicator/viewer Physics 4 Expired
US4598527A Skin packaging machine with temperature sensing probe Performing Operations; Transporting 4 Expired
US4437152A Control arrangement for multifunction industrial machine Physics 3 Expired
US5712555A Voltage regulation for access cards Physics 1 Expired
US4535582A Skin packaging machine having microprocessor-based control Performing Operations; Transporting 1 Expired
US6554687B1 Precise crystallographic-orientation alignment mark for a semiconductor wafer Performing Operations; Transporting 0 Expired
US8319236B2 Low creep metallization for optoelectronic applications Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.