Steve Kientz
17Patents
4h-index
9Co-inventors
45Inventor score
Filing activity: Apr 30, 2018 → Feb 22, 2024
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10566063B2 | Memory system with dynamic calibration using a trim management mechanism | Physics | 13 | Active |
| US10664194B2 | Memory system with dynamic calibration using a variable adjustment mechanism | Physics | 6 | Active |
| US11177006B2 | Memory system with dynamic calibration using a trim management mechanism | Physics | 5 | Active |
| US11416173B2 | Memory system with dynamic calibration using a variable adjustment mechanism | Physics | 4 | Active |
| US10852953B2 | Dynamic temperature compensation in a memory component | Physics | 2 | Active |
| US11404124B2 | Voltage bin boundary calibration at memory device power up | Physics | 1 | Active |
| US11360670B2 | Dynamic temperature compensation in a memory component | Physics | 1 | Active |
| US11791004B2 | Threshold voltage offset bin selection based on die family in memory devices | Physics | 0 | Active |
| US10878910B2 | Memory start voltage management | Physics | 0 | Active |
| US11545227B2 | Threshold voltage offset bin selection based on die family in memory devices | Physics | 0 | Active |
| US11842772B2 | Voltage bin boundary calibration at memory device power up | Physics | 0 | Active |
| US11721399B2 | Memory system with dynamic calibration using a trim management mechanism | Physics | 0 | Active |
| US12141443B2 | Dynamic temperature compensation in a memory component | Physics | 0 | Active |
| US12346588B2 | Apparatus with memory cell calibration mechanism and methods for operating the same | Physics | 0 | Active |
| US11733929B2 | Memory system with dynamic calibration using a variable adjustment mechanism | Physics | 0 | Active |
| US11675509B2 | Multiple open block families supporting multiple cursors of a memory device | Physics | 0 | Active |
| US10482965B1 | Memory start voltage management | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.