Inventor · Sagamihara, JP

Takeo Oomori

20Patents
6h-index
13Co-inventors
62Inventor score

Filing activity: Feb 14, 2001 → Nov 25, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US7643137B2 Defect inspection apparatus, defect inspection method and method of inspecting hole pattern Physics 13 Expired
US6693293B2 Surface inspection apparatus using radiation or light Physics 10 Expired
US6774987B2 Surface inspection method, surface inspection apparatus, and recording medium and data signal for providing surface inspection program Physics 10 Expired
US6563577B2 Defect testing apparatus and defect testing method Physics 9 Expired
US7369224B2 Surface inspection apparatus, surface inspection method and exposure system Physics 7 Active
US6646735B2 Surface inspection apparatus and surface inspection method Physics 7 Expired
US7298471B2 Surface inspection apparatus and surface inspection method Electricity 6 Expired
US8446578B2 Defect inspection apparatus, defect inspection method and method of inspecting hole pattern Physics 5 Active
US7372557B2 Surface defect inspection apparatus and surface defect inspection method Physics 5 Active
US7692780B2 Surface inspecting apparatus Physics 5 Active
US6512579B2 Defect inspection apparatus Physics 4 Expired
US7307725B2 Surface inspection apparatus, polarization illuminating device and light-receiving device Physics 4 Active
US6654113B2 Surface inspection apparatus Physics 4 Expired
US7557912B2 Defect inspection apparatus and defect inspection method Physics 2 Active
US7697139B2 Surface inspection apparatus Physics 1 Active
US8687182B2 Surface inspection apparatus and surface inspection method Electricity 1 Active
US9708955B2 Exhaust purifying device Emerging Cross-Sectional Technologies 0 Active
US8441627B2 Surface inspection apparatus and surface inspection method Electricity 0 Active
US7990535B2 Surface state detecting apparatus Physics 0 Active
US7834993B2 Surface inspection apparatus and surface inspection method Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.