Te-Sheng WANG
11Patents
2h-index
15Co-inventors
43Inventor score
Filing activity: Sep 26, 2014 → Dec 29, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10359705B2 | Indirect determination of a processing parameter | Electricity | 6 | Active |
| US10372043B2 | Hotspot aware dose correction | Physics | 3 | Active |
| US11243473B2 | Measurement method and apparatus | Physics | 2 | Active |
| US9166846B1 | Eye diagram construction display apparatus | Electricity | 1 | Active |
| US11029609B2 | Simulation-assisted alignment between metrology image and design | Physics | 1 | Active |
| US10852646B2 | Displacement based overlay or alignment | Physics | 1 | Active |
| US11592752B2 | Apparatus and method for process-window characterization | Physics | 0 | Active |
| US12197134B2 | Apparatus and method for process-window characterization | Physics | 0 | Active |
| US11669018B2 | Simulation-assisted alignment between metrology image and design | Physics | 0 | Active |
| US10656531B2 | Apparatus and method for process-window characterization | Physics | 0 | Active |
| US12315175B2 | Method in the manufacturing process of a device, a non-transitory computer-readable medium and a system configured to perform the method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.