Thomas Altmann
12Patents
7h-index
29Co-inventors
66Inventor score
Filing activity: Mar 27, 1996 → Sep 19, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6899762B2 | Epitaxially coated semiconductor wafer and process for producing it | Emerging Cross-Sectional Technologies | 27 | Expired |
| US6514424B2 | Process for the double-side polishing of semiconductor wafers and carrier for carrying out the process | Electricity | 27 | Expired |
| US6583050B2 | Semiconductor wafer with improved flatness, and process for producing the semiconductor wafer | Performing Operations; Transporting | 22 | Expired |
| US6861360B2 | Double-sided polishing process for producing a multiplicity of silicon semiconductor wafers | Performing Operations; Transporting | 14 | Expired |
| US6458688B1 | Semiconductor wafer with improved flatness, and process for producing the semiconductor wafer | Performing Operations; Transporting | 12 | Expired |
| US6793837B2 | Process for material-removing machining of both sides of semiconductor wafers | Performing Operations; Transporting | 8 | Expired |
| US5952545A | Nucleic acid molecules encoding cytochrome P450-type proteins involved in the brassinosteroid synthesis in plants | Physics | 7 | Expired |
| US6645862B2 | Double-side polishing process with reduced scratch rate and device for carrying out the process | Performing Operations; Transporting | 7 | Expired |
| US7927571B2 | Method and device for producing high purity polycrystalline silicon with a reduced dopant content | Chemistry; Metallurgy | 5 | Active |
| US7631407B2 | Machine tool and method for cutting machining of work pieces | Emerging Cross-Sectional Technologies | 2 | Active |
| US11390794B2 | Robust alkyl ether sulfate mixture for enhanced oil recovery | Chemistry; Metallurgy | 1 | Active |
| US10711224B2 | Compositions and methods useful for removing tablet coatings | Chemistry; Metallurgy | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.