Inventor · Ibaraki, JP

Tomoya Taguchi

18Patents
1h-index
16Co-inventors
47Inventor score

Filing activity: Mar 3, 2011 → Jul 31, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US8993361B2 Manufacturing method for edge illuminated type photodiode and semiconductor wafer Emerging Cross-Sectional Technologies 1 Active
US11233354B2 Hermetic terminal and sensor unit Electricity 1 Active
US9096954B2 Metal nanoparticle array structure, device for producing same, and method for producing same Chemistry; Metallurgy 1 Active
US11413708B2 Workpiece cutting method Performing Operations; Transporting 0 Active
USD897974S1 Semiconductor wafer General 0 Active
USD884660S1 Light-receiving device General 0 Active
US11276794B2 Backside illuminated semiconductor photodetection element Electricity 0 Active
US11367655B2 Forming openings at intersection of cutting lines Performing Operations; Transporting 0 Active
US11450695B2 Method for manufacturing back surface incident type semiconductor photo detection element Electricity 0 Active
US11239266B2 Back-illuminated semiconductor photodetection element Electricity 0 Active
US12272701B2 Method for manufacturing back surface incident type semiconductor photo detection element Electricity 0 Active
US12021104B2 Back surface incident type semiconductor photo detection element Electricity 0 Active
US11764236B2 Method for manufacturing back surface incident type semiconductor photo detection element Electricity 0 Active
US12017504B2 Duct structure Emerging Cross-Sectional Technologies 0 Active
US9385151B2 Manufacturing method for edge illuminated type photodiode and semiconductor wafer Emerging Cross-Sectional Technologies 0 Active
USD884659S1 Light-receiving device General 0 Active
US10633297B2 Method of manufacturing honeycomb structure Chemistry; Metallurgy 0 Active
US8889080B2 Near-field light microchannel structure and near-field light microreactor Performing Operations; Transporting 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.