Inventor · Suwon-si, KR

Uk-Rae Cho

49Patents
12h-index
41Co-inventors
81Inventor score

Filing activity: Sep 15, 1988 → Mar 31, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US6573746B2 Impedance control circuit Physics 75 Expired
US6525558B2 Programmable impedance control circuit Electricity 61 Expired
US6661250B2 Programmable impedance control circuit Electricity 47 Expired
US6901014B2 Circuits and methods for screening for defective memory cells in semiconductor memory devices Physics 43 Expired
US6947336B2 Semiconductor device with impedance control circuit Physics 37 Expired
US6839286B2 Semiconductor device with programmable impedance control circuit Physics 35 Expired
US6456124B1 Method and apparatus for controlling impedance of an off-chip driver circuit Electricity 34 Expired
US6429679B1 Programmable impedance control circuit and method thereof Electricity 31 Expired
US6642740B2 Programmable termination circuit and method Electricity 30 Expired
US6594818B2 Memory architecture permitting selection of storage density after fabrication of active circuitry Electricity 20 Expired
US7525173B2 Layout structure of MOS transistors on an active region Electricity 15 Active
US9318607B2 Semiconductor device and method of fabricating the same Electricity 13 Active
US7307441B2 Integrated circuit chips and wafers including on-chip test element group circuits, and methods of fabricating and testing same Electricity 12 Expired
US7825710B2 Delay-locked loop circuits and method for generating transmission core clock signals Electricity 11 Expired
US6556038B2 Impedance updating apparatus of termination circuit and impedance updating method thereof Electricity 9 Expired
US6617894B2 Circuits and methods for generating internal clock signal of intermediate phase relative to external clock Electricity 8 Expired
US7616512B2 Semiconductor memory device with hierarchical bit line structure Physics 8 Active
US6785173B2 Semiconductor memory device capable of performing high-frequency wafer test operation Physics 8 Expired
US7002822B2 Content addressable memory device Physics 7 Expired
US7295489B2 Method and circuit for writing double data rate (DDR) sampled data in a memory device Physics 7 Expired
US7489570B2 Semiconductor memory device with hierarchical bit line structure Physics 7 Active
US6583647B2 Signal converting system having level converter for use in high speed semiconductor device and method therefor Electricity 6 Expired
US4912055A Method of fabricating a semiconductor device Electricity 6 Expired
US4970174A Method for making a BiCMOS semiconductor device Emerging Cross-Sectional Technologies 6 Expired
US6930508B2 Integrated circuit with on-chip termination Electricity 6 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.