Inventor · Sunnyvale, CA, US

Viachslav Babayan

20Patents
5h-index
27Co-inventors
61Inventor score

Filing activity: Jun 8, 2015 → Sep 7, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US9865484B1 Selective etch using material modification and RF pulsing Electricity 109 Active
US9964863B1 Post exposure processing apparatus Electricity 14 Active
US10203604B2 Method and apparatus for post exposure processing of photoresist wafers Electricity 13 Active
US9829790B2 Immersion field guided exposure and post-exposure bake process Physics 10 Active
US9958782B2 Apparatus for post exposure bake Electricity 7 Active
US10474033B2 Method and apparatus for post exposure processing of photoresist wafers Electricity 3 Active
US10615058B2 Apparatus for field guided acid profile control in a photoresist layer Electricity 2 Active
US11550224B2 Apparatus for post exposure bake Electricity 1 Active
US10401742B2 Post exposure processing apparatus Electricity 1 Active
US11262662B2 Post exposure processing apparatus Electricity 1 Active
US11112697B2 Method and apparatus for post exposure processing of photoresist wafers Electricity 1 Active
US11049701B2 Biased cover ring for a substrate processing system Electricity 1 Active
US12057329B2 Selective etch using material modification and RF pulsing Electricity 0 Active
US10858727B2 High density, low stress amorphous carbon film, and process and equipment for its deposition Electricity 0 Active
US10754252B2 Apparatus for post exposure bake Electricity 0 Active
US11094573B2 Method and apparatus for thin wafer carrier Chemistry; Metallurgy 0 Active
US10845715B2 Post exposure processing apparatus Electricity 0 Active
US10566177B2 Pulse shape controller for sputter sources Electricity 0 Active
US11899366B2 Method and apparatus for post exposure processing of photoresist wafers Electricity 0 Active
US10954594B2 High temperature vapor delivery system and method Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.