Yan Chen
45Patents
5h-index
56Co-inventors
68Inventor score
Filing activity: Feb 7, 2006 → Dec 5, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7467064B2 | Transforming metrology data from a semiconductor treatment system using multivariate analysis | Physics | 11 | Active |
| US7327475B1 | Measuring a process parameter of a semiconductor fabrication process using optical metrology | Electricity | 11 | Active |
| US9217848B1 | Mobile device and optical imaging lens thereof | Electricity | 11 | Active |
| US9330990B2 | Method of endpoint detection of plasma etching process using multivariate analysis | Electricity | 9 | Active |
| US8170833B2 | Transforming metrology data from a semiconductor treatment system using multivariate analysis | Physics | 8 | Active |
| US7522294B2 | Measuring a process parameter of a semiconductor fabrication process using optical metrology | Electricity | 4 | Active |
| US9970818B2 | Spatially resolved optical emission spectroscopy (OES) in plasma processing | Physics | 4 | Active |
| US10002804B2 | Method of endpoint detection of plasma etching process using multivariate analysis | Electricity | 4 | Active |
| US7523021B2 | Weighting function to enhance measured diffraction signals in optical metrology | Physics | 3 | Active |
| US10453653B2 | Endpoint detection algorithm for atomic layer etching (ALE) | Electricity | 3 | Active |
| US10473525B2 | Spatially resolved optical emission spectroscopy (OES) in plasma processing | Physics | 3 | Active |
| US9851532B2 | Mobile device and optical imaging lens thereof | Physics | 2 | Active |
| US8346506B2 | Transforming metrology data from a semiconductor treatment system using multivariate analysis | Physics | 2 | Active |
| US7428044B2 | Drift compensation for an optical metrology tool | Physics | 2 | Active |
| US10332861B2 | Interconnection structures and methods for making the same | Electricity | 2 | Active |
| US9857558B1 | Optical imaging lens | Physics | 2 | Active |
| US11538723B2 | Optical diagnostics of semiconductor process using hyperspectral imaging | Electricity | 1 | Active |
| US9798108B2 | Mobile device and optical imaging lens thereof | Physics | 1 | Active |
| US8929000B2 | Mobile device and optical imaging lens thereof | Electricity | 1 | Active |
| US9341816B2 | Mobile device and optical imaging lens thereof | Electricity | 1 | Active |
| US9377602B2 | Imaging lens, and electronic apparatus including the same | Physics | 1 | Active |
| US9541734B2 | Mobile device and optical imaging lens thereof | Physics | 1 | Active |
| US9217843B2 | Mobile device and optical imaging lens thereof | Physics | 1 | Active |
| US9557525B2 | Mobile device and optical imaging lens thereof | Electricity | 1 | Active |
| US10205520B2 | Method and device for measuring optical signal-to-noise ratio | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.