Yesin Ryu
14Patents
2h-index
24Co-inventors
46Inventor score
Filing activity: Oct 30, 2019 → Nov 20, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11170868B2 | Semiconductor memory devices and memory systems | Physics | 6 | Active |
| US11436079B2 | Semiconductor memory devices having enhanced error correction circuits therein | Electricity | 2 | Active |
| US11194653B2 | Semiconductor memory device, and memory system having the same | Physics | 1 | Active |
| US11487615B2 | Semiconductor memory devices and methods of operating semiconductor memory devices | Electricity | 1 | Active |
| US11604693B2 | Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same | Physics | 1 | Active |
| US11508456B2 | Semiconductor memory device capable of increasing flexibility of a column repair operation | Physics | 1 | Active |
| US11841763B2 | Semiconductor memory devices with ECC engine defect determination based on test syndrome, test parity, expected decoding status and received decoding status | Physics | 0 | Active |
| US11681458B2 | Memory device and method reading data | Physics | 0 | Active |
| US12117901B2 | Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same | Physics | 0 | Active |
| US11366716B2 | Semiconductor memory devices | Electricity | 0 | Active |
| US12373285B2 | Memory device, a controller for controlling the same, a memory system including the same, and an operating method of the same | Physics | 0 | Active |
| US11527303B2 | Memory devices having variable repair units therein and methods of repairing same | Physics | 0 | Active |
| US11551775B2 | Semiconductor memory devices and memory systems including the same | Physics | 0 | Active |
| US11791014B2 | Memory devices having variable repair units therein and methods of repairing same | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.