Yin Long
9Patents
1h-index
14Co-inventors
40Inventor score
Filing activity: Dec 20, 2012 → Jun 18, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8865482B2 | Method of detecting the circular uniformity of the semiconductor circular contact holes | Emerging Cross-Sectional Technologies | 37 | Active |
| US9269639B2 | Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device | Electricity | 1 | Active |
| US9080863B2 | Method for monitoring alignment between contact holes and polycrystalline silicon gate | Electricity | 0 | Active |
| US12198061B2 | Method and apparatus for predicting yield of semiconductor devices | Electricity | 0 | Active |
| US11687488B2 | Directory deletion method and apparatus, and storage server | Physics | 0 | Active |
| US8987013B2 | Method of inspecting misalignment of polysilicon gate | Electricity | 0 | Active |
| US11344719B2 | Electric bandage for accelerated wound recovery | Human Necessities | 0 | Active |
| US11307151B2 | Method for detecting wafer backside defect | Physics | 0 | Active |
| US8658438B2 | Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.