Inventor · Osaka, JP

Yohei Takechi

12Patents
2h-index
17Co-inventors
47Inventor score

Filing activity: Apr 5, 2005 → Jul 19, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US8181524B2 Ultrasonic stress measurement method and device Physics 3 Active
US8885848B2 Quality evaluation method and quality evaluation apparatus Physics 2 Active
US11408722B2 OCT measuring device and oct measuring method Physics 0 Active
US11975403B2 Laser processing apparatus, laser processing method, and correction data generation method Performing Operations; Transporting 0 Active
US11648629B2 Laser processing apparatus, laser processing method, and correction data generation method Physics 0 Active
US12403548B2 Laser processing apparatus and laser processing method Physics 0 Active
US9977229B2 Inner layer measurement method and inner layer measurement device Physics 0 Active
US8593624B2 Refractive index measuring apparatus Physics 0 Active
US11969823B2 Laser processing apparatus and laser processing method Performing Operations; Transporting 0 Active
US11648624B2 Laser processing apparatus and optical adjustment method Physics 0 Active
US9500861B2 Protective member and method for using protective member Physics 0 Active
US7411748B2 Optical component unit, laser joining method and apparatus for joining optical component Performing Operations; Transporting 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.