Inventor · Seoul, KR

Yoon Jae Kim

18Patents
4h-index
23Co-inventors
56Inventor score

Filing activity: Jun 25, 2008 → Feb 8, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US10043879B1 Semiconductor devices utilizing capping layers with multiple widths and methods of manufacturing the same Electricity 13 Active
US8005562B2 Process-parameter prognostic system for predicting shape of semiconductor structure, semiconductor fabrication apparatus having the system, and method of using the apparatus Electricity 9 Active
US9997538B2 Semiconductor device including channel structure Electricity 7 Active
US9142536B2 Semiconductor device and method for fabricating the same Electricity 6 Active
US8222821B2 Pulse plasma matching systems and methods including impedance matching compensation Electricity 2 Active
US12183545B2 Plasma reactor Electricity 1 Active
US8486787B2 Method of fabricating semiconductor device Electricity 1 Active
US11579076B2 Method and apparatus for correcting error of optical sensor, apparatus for estimating bio-information Physics 0 Active
US11682184B2 Apparatus and method for estimating bio-information, and optical sensor Physics 0 Active
US12055487B2 Apparatus and method for analyzing substance of object Physics 0 Active
US12364417B2 Electronic device and method of estimating bioinformation Human Necessities 0 Active
US12295701B2 Apparatus and method for estimating bio-information Human Necessities 0 Active
US11359965B2 Apparatus and method for estimating target component Physics 0 Active
US11883166B2 Apparatus and method for estimating component of analyte Physics 0 Active
US12412661B2 Electronic device and method of providing health guideline using the same Physics 0 Active
US8277906B2 Method of processing a substrate Electricity 0 Active
US11971348B2 Electronic device and method of estimating bio-information using the same Physics 0 Active
US8498731B2 Method of using process-parameter prognostic system for predicting shape of semiconductor structure Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.